AUTHORS: Michal Šír, Ivan Feňo
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ABSTRACT: Defects in material structure effects the ON-state resistance of GaN devices, which can’t be considered constant in power loss evaluation when considering high operating frequency. The aim of this article is to propose a novel method to measure the dynamic RDSon. The method resolves a typical disadvantage of former methods e.g. an unclear clamping diode voltage drop in former approaches. Test results obtained with the new method are presented for 3 samples provided by different suppliers. Results shows that each sample exhibits a different dynamic RDSon characteristics what indicates a different process technology used to manufacture the device.
KEYWORDS: GaN semiconductor, Novel RDSon Measurement method, Dynamic On state resistance, Dynamic RDSon
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